Frequently Asked Questions
1. What separates KUBTEC from the competition?
We offer continuing leadership in digital x-ray systems technology. The Kubtec systems are designed and manufactured to meet the evolving needs of our customers and to marry the best new technologies with digital x-ray systems for the finest specimen radiography and irradiators systems available. From our inception in 2005 we have been bringing innovation to the field of digital x-ray. Among the firsts KUBTEC has brought to the marketplace is the ability to send multiple images to PACS, the ability to save images in multiple formats, make on screen measurements and annotate images. We were the first to introduce the touch screen option to specimen radiography systems, the first to offer 16 bit images and the first to offer the largest detector available for specimen radiography (17” x 17”). For KUBTEC’s XPERT 40 we are the first to bring digital mammography quality imaging to specimen x-ray systems with our Artemis option.
Our XCELL line of irradiators offer a more compact footprint for irradiating specimens in accurate repeatable monitored doses, unlike radioisotope based systems, requiring no NRC licensing. The user-friendly controls allow the user to preset warm-up times, time formats, focal spot sizes and other operating modes and our systems have user-friendly software that can be operated without any x-ray training.
2. How does Kubtec’s detector technology compare to single wafer detector design?
Kubtec uses tiled detectors for digital radiography because they offer a wide range of advantages over single wafer detectors. After extensive evaluation, for our XPERT family of digital x-ray systems, KUBTEC determined that tiled detectors offer greater sensitivity and shorter image acquisition time to provide the highest quality images in the least amount of time. Tiled detectors have multiple channels to transmit data simultaneously, while single wafer detectors have only one channel to transmit data to the computer.
In addition, a standard single wafer detector of 12 cm x 12 cm utilizes only 10 cm x 10 cm of the detector area. A KUBTEC tiled detector of 10 cm x 10 cm illuminated with 1.0 mA x-ray source offers a full 10 cm x 10 cm image. Both tiled and single wafer detectors include a small number of inactive pixels, and both single wafer and tiled detectors use sophisticated software technology to resolve data from these inactive pixels. With tiled detectors the inactive pixels are confined to specific areas and can be easily located. With single wafer detectors inactive pixels are randomly scattered and may lead to misidentification of anomalies.